Christopher M. Heirwegh1, William Timothy Elam2, Yang Liu1, Anusheela Das1, Christopher Hummel1,
Bret Naylor1, Lawrence A. Wade1, Abigail C. Allwood1, Joel A. Hurowitz3, Les G. Armstrong1, Naomi Bacop1,
Lauren P. O’Neil2, Kimberly P. Sinclair2, Michael E. Sondheim1, Robert W. Denise1, Peter R.Lawson1,
Rogelio Rosas1, Jonathan H. Kawamura1, Mitchell H. Au1, Amarit Kitiyakara1, Marc C. Foote1,
Raul A. Romero1, Mark S. Anderson1, George R. Rossman4, Benton C. Clark III5
1) Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109 USA
2) Applied Physics Laboratory, University of Washington, Seattle, WA 98105 USA
3) Department of Geosciences, Stony Brook University, Stony Brook, NY 11974 USA
4) Division of Geological and Planetary Sciences, California Institute of Technology, Pasadena, CA 91125 USA
5) Space Sciences Institute, Boulder, CO 80301 USA
The
Planetary Instrument for X-ray Lithochemistry (PIXL) is a rasterable
focused-beam X-ray fluorescence (XRF) spectrometer mounted on the arm
of National Aeronautics and Space Administration's (NASA) Mars 2020
Perseverance rover. To ensure that PIXL would be capable of performing
accurate in-flight compositional analysis of martian targets, in situ,
an elemental calibration was performed pre-flight on the PIXL flight
instrument in a simulated martian environment. The details of this
calibration, and implications for measuring unknown materials on Mars
are the subjects of this paper. The major goals of this calibration
were both to align the spectrometer to perform accurate elemental
analysis and, to derive a matrix of uncertainties that are applied to
XRF measurements of all elements in unknown materials. A small set of
pure element and pure compound targets and geologically relevant
reference materials were measured with the flight hardware in a
simulated martian environment. Elemental calibration and
quantifications were carried out using PIXL's XRF quantification
software (PIQUANT). Uncertainties generated were implemented into the
PIQUANT software version employed by the PIXL's data visualization
software (PIXLISE). We outline in this work, a list of factors that
impact micro-XRF accuracy, the methodology and steps involved in the
calibration, details on the fabrication of the uncertainty matrix,
instructions on the use and interpretations of the uncertainties
applied to unknowns and an assessment on the limitations and areas open
to future improvement as part of subsequent calibration efforts.